[J721S2][ECC] : ECC DED testing is failing for certain RAM IDs for SDL_COMPUTE_CLUSTER0_7

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    • Type: Bug
    • Resolution: Fixed
    • Priority: Medium
    • Processors Software Diagnostics Library
    • PROC_SDL-7432
    • PROC_SDL_JACINTO_01.03.00
    • PROC_SDL_JACINTO_01.04.00
    • j721s2-evm
    • No known workaround. Issue could be test setup or incorrect metadata. Investigation is ongoing.

      The below checker groups are failing for ECC DED testing.

      SDL_COMPUTE_CLUSTER0_7 (97)

                                   RAM Id 5 is failing for checker-group (0)

                                   RAM Id 7 is failing for checker-group (0)

                                   RAM Id 9 is failing for checker-group (0)

                                   RAM Id 11 is failing for checker-group (0)

            Assignee:
            TI User
            Reporter:
            TI User
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              Created:
              Updated:
              Resolved:

                Connection: Intermediate to External PROD System
                EXTSYNC-4511 - [J721S2][ECC] : ECC DED testing is ...
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