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Type: Bug
Resolution: Fixed
Priority: Medium

Product:
PDK
Internal ID:
PDK-8601
Found In Release:
PROCESSOR_SDK_07.01.00
Fix In Release:
PROCESSOR_SDK_08.05.00
Affected Platform/Device:

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j7200-evm
j721s2-evm
j784s4-evm

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j7200-evm j721s2-evm j784s4-evm

CSL ECC test app gets stuck for ded test on j721e from mpu1_0 core, for j7200 the test fails on both cores i.e. mcu1_0 and mpu1_0

Assignee:: TI User

Reporter:: TI User

Votes:: 0 Vote for this issue

Watchers:: 2 Start watching this issue

Created:: 02/Apr/21 2:24 AM

Updated:: 12/Dec/22 8:10 AM

Resolved:: 12/Dec/22 8:10 AM

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